New nuclear event detector cuts radiation response time by 50%

Micross has introduced the Standard-Performance Nuclear Event Detector (NED), a new radiation detection device designed to protect critical electronics in nuclear events, particularly for defense and aerospace platforms such as aircraft, military satellites, and unmanned systems. This detector offers significant improvements over legacy systems by delivering more than twice the radiation dose-rate sensitivity and reducing response times by over 50%, with detection speeds reaching 3 to 5 nanoseconds under high radiation conditions. Key to these advancements is a redesigned architecture that integrates differential drivers and receivers on-chip, eliminating external circuitry, reducing system latency, size, weight, power consumption, and shielding requirements. Manufactured in the U.S. with a custom ASIC produced by Jazz Semiconductor Trusted Foundry, the NED is a commercial off-the-shelf solution enabling faster integration without lengthy development cycles. It supports extreme operating conditions, including total radiation doses up to one million rads, dose rates in the billions of rads per second, high neutron exposure, and a wide temperature